Interactive view of wear-out-only, electronic/power-only, and overlap failures, with emphasis on how nearly every failure sits in the shared “Both” cohort.
Total SMART failures
All failed SSDs in the summary set
Both wear-out + electronic/power
Electronic/power only
Wear-out only
Cohort contrast
The overlap dominates both cohorts, leaving almost no standalone electronic/power failures and no standalone wear-out failures.
Overlap shared by both cohorts
Tiny standalone electronic/power tail
No standalone wear-out tail
Wear-out cohort
Electronic/power cohort
Loading cohort note
Failure category breakdown
Absolute counts make the size gap obvious: the shared “Both” bucket overwhelms the two exclusive categories.
Overlap versus exclusive failures by cohort
Each cohort is decomposed into shared overlap and exclusive failures, showing that the wear-out cohort is entirely overlap-driven.